MICROTEST provides the latest software available for download, if you have any download issues, please contact email@example.com
MICROTEST provides the latest version of datasheet and video available for download, if you have any download issues, please contact firstname.lastname@example.org
Why is the LCR display not clear?
Unclear display of the meter may be brought about by the contrast setting of the monitor. Turn the knob on the instrument to adjust the contract setting.
What type of RS232 should be selected for the instrument?
The RS232 used for our instrument must be a Null Modem connection cable as shown in the figure below:
The cable/harness tester shows a bad insulation in its self-inspection during the booting.
This may occur generally when the ambient humidity becomes higher or the instrument is not used and stored for a prolonged period of time. If still not improvement, please contact us to confirm the issue.
What is the difference between the Hi-Pot tester and Insulation Resistance Tester?
The insulation resistance test is a qualitative test to express the relative quality of the insulating system. 500Vdc or 1000Vdc is usually used for the test and the result is expressed in MΩ.
The hi-pot test is a quantitative test and the high voltage used for the test is usually higher than the insulating resistance test. The test can be executed using AC or DC voltage and the result is expressed in mA or μA.
What is ramp time?
Ramp time is the time during which the voltage to be tested rises gradually to the preset test voltage. It is usually used in the capacitive loading of the DC hi-pot test to avoid instantaneous charging overcurrent due to instantaneous increase of the voltage to the object to be tested, which may bring about erroneous measurement.
What is arc?
Arc is an arcing or flashover phenomenon that voltage produces from the surface of one conductor to another during a high voltage test.
What is the difference between LCR Meter and Impedance Analyzer?
LCR Meter is used for measuring the passive components: resistor (R), inductor (L) and Capacitor (C). Our Impedance Analyzer is a high-frequency model with graphic scanning function and can be used for analysis of more parameters.
Do different frequencies have an effect on the test result of the same component?
Yes. Since the inductance and capacitance change in the impedance depending on the frequency, the range of the frequency must be defined for the measurement of the component.
Do different voltages have an effect on the test result of the same component?
Yes. Since every component has its own dielectric constant (k), the characteristics of the component vary when different voltages are input.
Why does calibration and reset are required for the instrument?
In addition to the instrument itself, error may occur to the test lead and interfacing connection due to some external factors such as contact resistance, inductance and parallel capacitance. Erroneous measurement may occur if the test is conducted without prior calibration and reset.
When should “Auto Shift” be used? And when should “Fixed Shift” be used?
“Auto Shift” is for testing components with an unknown value; “Fixed Shift” is for testing components with a known value. When performing a large number of tests within a same range, the fixed shift elevates the test efficiency of the instrument.
What is the function of ALC?
The voltage setting for testing components may be reduced due to the serial effect of internal output impedance of the instrument and impedance of the wire or fixture with the object under test (OUT), resulting in reduced voltage across the OUT, and therefore different measurements (especially when testing a small impedance). When this function is enabled, the instrument will based on the actually measured voltage, elevate the signal voltage to reach the voltage setting at the testing end.
What’s the function of BIN Sorting?
BIN Sorting is used for sorting products as well as upper/lower limits of Good and NG products. Multiple sorting criteria can be set. For example, 1KΩ resistors can be sorted by % of the standard value by 0.1%, 1%, or 5%, or even by absolute values. Sorting results are displayed on the screen. It can also be output from the rear HANDLER I/O interface for combining with automated devices for automatic sorting.
Why is a graph obtained from scanned frequencies different from that of other brands of analysis instruments?
In addition to verifying the settings of test criteria for similarity, the most frequently seen reason is different settings of graph displays. As shown below, one graph is a logarithmic presentation while the other is linear; you may see at a glance that the resulting measurements are different.
Why can’t we perform setting by just touching the screen?
The 6630 impedance analyzer is an industrial one, which differs from domestic apparatuses where a touch panel is necessary for facilitating the operation. Besides laboratories and QC units, many applications of the 6630 impedance analyzer are combined with a package tester in production lines where most operators wear gloves that constitute a touching problem. On the other hand, to prevent any operator from directly touching the panel with tools, we stick with using physical pushbuttons for the setting the operation.
Regarding optional wire or fixture of the 6630 impedance analyzer, are there any limitations if we are to make them ourselves?
The 6630 impedance analyzer provides a maximum frequency of 30MHz, special cautions must be taken when using wires or fixtures for optimizing the precision of test results. Since the properties of the length and position of wires and/or fixtures are more critical at high frequencies, we suggest that MICROTEST’s standard or optional wires and fixtures must be used.
What is the function of 6630 impedance analyzer Multi-step ? When and how is this used?
Contrasting with general test instruments that provide single or multiple test parameters under a single test condition (e.g., measuring L and Q at 10KHz, 1V), the 6630 impedance analyzer is not only capable of simultaneously testing 4 sets of parameters at a single test condition (meter mode), but also features an additional multi-step test mode capable of editing up to 15 different items of frequency, voltage, measurement, etc. allowing carrying out sequential tests at one trigger and displaying the results on the screen at the same time; this facilitates promptly testing out all the parameters of the DUT at all the different conditions, therefore it facilitates the analysis.
Why do coil components need to be tested with DC Bias Current Source?
Due to magnetic saturation properties of iron-core components, inductance tends to become lower when loaded with DC Bias Current Source, therefore affecting rectification functionality of the filter coil. DC Bias Current Source provides stable output of the DC current, and precision inductance measurement is carried out with an LCR meter, applicable to magnetic saturation analysis of coil components.
After loading with a DC Bias Current Source, an isolating capacitor must be provided to prevent the DC current from flowing into the LCR meter, then how can the DCR value be measured on the machine?
In addition to controlling output current magnitude, the DC Bias Current Source is also capable of detecting the current and the voltage on the output terminals. The DCR function combined with a Bias machine is achieved by way of [V= Ix R], therefore the DCR of the DUT is obtained using the known output current and the differential voltages across the DUT.
If there is no temperature sensor seen in the MICROTEST DC Bias Current Source, why can the temperature rise of the DUT be measured?
The DC Bias Current Source employs the property of positive temperature coefficient of a copper conductor (i.e., higher resistance at higher temperature), the formula is R2 = R1[1 + a(t2-t1)], where “a” represents 0.0039. Resistance R1 is measured prior to applying the current, followed by measuring the resistance alteration after the current application, the present temperature can then be deduced with the formula, thus getting the temperature rise.
Regarding the optional wire or fixture used for the DC Bias Current Source, are there any limitations if we are to make them ourselves?
Since the DC Bias Current Source provides a rather large current, therefore special cautions must be taken on the diameter and length of wires. Moreover, the instrument has a 3MHz bandwidth; therefore high-frequency properties of the wire are also critical. We suggest that you contact and discuss with MICROTEST, for we have bountiful customizing experiences that will surely identify an optimal conjunction for you.
The LCR unit I have purchased is for 10MHz frequency, how come it indicates 3MHz when I used it in combination with a DC Bias?
When you use it with a unit of DC Bias Current Source, additional impedance is connected in parallel; it affects the precision of measurement. Although the effect of the parallel impedance and circuitry is minimized, there is still a certain limitation in high-frequency properties, therefore the warranted precision indicated is 3MHz.
RMA Online Customer Service & repair Management System
Thank you for purchasing MICROTEST’s product. If any inspection or repair regarding your product is needed, please use our online repair management and tracking system or phone our customer service agent.
Repair and customer service hours: Monday to Friday 8:30-12:00, 13:00~17:30 [excl. holidays and national holidays]