MICROTEST CORP Joins SEMI to Connect with the Global Semiconductor Ecosystem

MICROTEST CORP officially announces its membership in SEMI (Semiconductor Equipment and Materials International), strengthening its role in the global semiconductor technology supply chain.

With this milestone, MICROTEST CORP will further align with the international semiconductor industry, driving innovation in the verification and testing of semiconductor materials and components. As semiconductor technologies advance toward higher frequencies, miniaturization, and high-power applications, the demand for high-precision electrical characterization during the development phase is rapidly increasing. Dedicated to the R&D of electronic measurement instruments, MICROTEST CORP's LCR Meters and Impedance Analyzers have been widely adopted in testing processes for semiconductor materials, passive components, and chip-level packaging, offering high-efficiency and reliable solutions for production and R&D teams.

Enabling Semiconductor Material Verification — MICROTEST CORP's Solutions as Key Instruments in Advanced Processes
MICROTEST 6632 Impedance Analyzer adopts a 4-terminal automatic balanced bridge measurement technique and supports a wide frequency range from 10 Hz to 50 MHz. It is ideal for precision testing of high-frequency ceramic capacitors, inductors, composite materials, integrated passive devices (IPD), and electrical packaging materials in semiconductors. To enhance equivalent circuit modeling of materials and devices, the 6632 is equipped with 3-element and 4-element model analysis functions, enabling engineers to build accurate behavioral models and significantly shorten simulation and verification cycles.

Additionally, its built-in dielectric constant testing function eliminates the need for manual calculations, making it especially suitable for dielectric material selection, stacked capacitor design, and high-frequency PCB evaluation. With external support for DC bias voltages up to 2000V, the 6632 can accurately characterize the C-V (capacitance-voltage) curves of high-power MOSFETs, IGBTs, GaN, and SiC devices under varying bias conditions—providing highly reliable data for advanced power design and reliability assessments.

MICROTEST CORP remains committed to delivering highly integrated, technology-driven test solutions that support semiconductor companies across material development, process control, and device validation. By establishing fast and quantifiable measurement benchmarks, MICROTEST CORP enables accelerated adoption and scaling of next-generation semiconductor devices.